Recent Progress in Nanoscale Indentation of Polymers Using the AFM.
Recent Progress in Nanoscale Indentation of Polymers
Using the AFM.
VanLandingham, M. R.; Villarrubia, J. S.; Meyers, G. F.
SEM IX International Congress on Experimental Mechanics.
Proceedings. Society for Experimental Mechanics. June
5-8, 2000, Orlando, FL, 912-915 pp, 2000.
polymers; microscopy; atomic force microscopy; blind
reconstruction; depth-sensing indenter; nanoindentation
For reliable indentation measurements, knowledge of the
shape of the indenter tip is required. For indentation
measurements involving sub-micrometer scale contacts,
accurate knowledge of the tip shape can be difficult to
achieve. In this paper, a technique referred to as blind
reconstruction is applied to the measurement of tip
shapes of indenters used in conjunction with the atomic
force microscope (AFM) to indent polymeric materials.
This method offers the potential for material
independent calibration of indenter tips with high
spatial resolution. Initial results from blind
reconstruction are compared to results of an indentation
tip shape calibration method, in which a reference
material of known modulus is indented using a range of
applied loads. Discrepancies between the two sets of
results are discussed in terms of experimental