BFRL Publications - x ray spectroscopy

x ray spectroscopy

• Comparison of Submicron Particle Analysis by Auger Electron Spectroscopy, Time-of-Flight Secondary Ion Mass Spectrometry, and Secondary Electron Microscopy With Energy Dispersive X-Ray Spectroscopy.
  Journal of Vacuum Science and Technology A: Vacuum, Surfaces, and Films, Vol. 14, No. 4, 2392-2404, July/August 1996.
  Childs, K. D.; Narum, D.; LaVanier, L. A.; Lindley, P. M.; Schueler, B. W.; Mulholland, G. W.; Diebold, A. C.